JPH0426435B2 - - Google Patents
Info
- Publication number
- JPH0426435B2 JPH0426435B2 JP59121402A JP12140284A JPH0426435B2 JP H0426435 B2 JPH0426435 B2 JP H0426435B2 JP 59121402 A JP59121402 A JP 59121402A JP 12140284 A JP12140284 A JP 12140284A JP H0426435 B2 JPH0426435 B2 JP H0426435B2
- Authority
- JP
- Japan
- Prior art keywords
- wiring
- circuit board
- measurement probe
- measurement
- information
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005259 measurement Methods 0.000 claims description 45
- 239000000523 sample Substances 0.000 claims description 39
- 238000005553 drilling Methods 0.000 claims description 18
- 238000012360 testing method Methods 0.000 claims description 16
- 238000010998 test method Methods 0.000 claims description 8
- 239000011295 pitch Substances 0.000 claims 1
- 239000000758 substrate Substances 0.000 description 12
- 238000007689 inspection Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000013461 design Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000001151 other effect Effects 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59121402A JPS61766A (ja) | 1984-06-13 | 1984-06-13 | 回路基板の布線試験方法およびその装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59121402A JPS61766A (ja) | 1984-06-13 | 1984-06-13 | 回路基板の布線試験方法およびその装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61766A JPS61766A (ja) | 1986-01-06 |
| JPH0426435B2 true JPH0426435B2 (en]) | 1992-05-07 |
Family
ID=14810288
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59121402A Granted JPS61766A (ja) | 1984-06-13 | 1984-06-13 | 回路基板の布線試験方法およびその装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61766A (en]) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3695501B2 (ja) | 1998-07-31 | 2005-09-14 | Ｎｏｋ株式会社 | ダイアフラムアクチュエータ |
-
1984
- 1984-06-13 JP JP59121402A patent/JPS61766A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61766A (ja) | 1986-01-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100712561B1 (ko) | 웨이퍼 형태의 프로브 카드 및 그 제조방법과 웨이퍼형태의 프로브 카드를 구비한 반도체 검사장치 | |
| JPH02224259A (ja) | 集積回路用プローブカードを検査する方法及び装置 | |
| EP0840130B1 (en) | Standard- and limited-access hybrid test fixture | |
| US3777260A (en) | Grid for making electrical contact | |
| US6191601B1 (en) | Test fixture for matched impedance testing | |
| KR100787829B1 (ko) | 프로브 카드 테스트 장치 및 테스트 방법 | |
| US5781021A (en) | Universal fixtureless test equipment | |
| GB2146849A (en) | Electrical test probe head assembly | |
| US6298312B1 (en) | Method of determining the tip angle of a probe card needle | |
| JP4667679B2 (ja) | プローブカード用基板 | |
| JPH0426435B2 (en]) | ||
| JP2001235505A (ja) | 回路基板検査装置 | |
| JPS62269075A (ja) | プリント基板検査装置 | |
| CN115598493A (zh) | 集成电路装置的检测系统、信号源及电源供应装置 | |
| JP2638556B2 (ja) | プローブカードチェッカー | |
| JPH1144709A (ja) | プローブカード | |
| US20250189573A1 (en) | Testing system for detecting a fault and a location of the fault | |
| JPS6171691A (ja) | 分割用プリント基板の分割溝配設もれ検出方法 | |
| JP3076424B2 (ja) | 回路基板検査方法と検査基板並びに回路基板検査装置 | |
| JP2000227451A (ja) | 回路基板検査装置 | |
| JP3191205B2 (ja) | プリント基板の検査装置 | |
| JPS6042915B2 (ja) | 回路基板の布線試験方法 | |
| JP3436183B2 (ja) | 半導体検査装置およびそれを用いた検査方法 | |
| JP3047361B2 (ja) | プローブニードルの位置検出方法 | |
| KR0127639B1 (ko) | 프로우빙 시험 방법 및 그 장치 |